INVESTIGATION OF CEMENTITIOUS PHASES IN CEMENTED PASTE BACKFILL BY SCANNING ELECTRON MICROSCOPY AND X-RAY DOT-MAPPING

9th International Symposium on Mining with Backfill
Bruno Bussière, Mostafa Benzaazoua, Michel Aubertin,
Keywords: Scanning electron microscope, Image analysis, cemented paste backfill, Mineralogy, Microstructural characterization, X-ray dot mapping
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